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[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Stuck-Open Fault Diagnosis with Stuck-At Model

✍ Scribed by Xinyue Fan, ; Moore, W.; Hora, C.; Gronthoud, G.

No coin nor oath required. For personal study only.

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