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[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Bias Superposition — An On-Line Test Strategy for a MEMS Based Conductivity Sensor

✍ Scribed by Jeffrey, C.; Zhou Xu, ; Richardson, A.

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[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Bias Superposition &#8212; An On-Line Test Strategy for a MEMS Based Conductivity Sensor