[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Multiple Errors Produced by Single Upsets in FPGA Configuration Memory: A Possible Solution

✍ Scribed by Reorda, M.S.; Sterpone, L.; Violante, M.

• Book ID: 118186312
• Publisher: IEEE
• Year: 2005
• Weight: 109 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780769523415
• DOI: 10.1109/ets.2005.29