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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Functional test generation for hard to detect stuck-at faults using RTL model checking

✍ Scribed by Prabhu, Mahesh; Abraham, Jacob A.

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