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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - On the quality of test vectors for post-silicon characterization

✍ Scribed by Sauer, Matthias; Czutro, Alexander; Becker, Bernd; Polian, Ilia

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