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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - On-chip test comparison for protecting confidential data in secure ICs

✍ Scribed by Da Rolt, Jean; Di Natale, Giorgio; Flottes, Marie-Lise; Rouzeyre, Bruno

No coin nor oath required. For personal study only.

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