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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - On-chip temperature and voltage measurement for field testing

✍ Scribed by Miura, Yukiya; Sato, Yasuo; Miyake, Yousuke; Kajihara, Seiji

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