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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Bandwidth-aware test compression logic for SoC designs

✍ Scribed by Janicki, Jakub; Tyszer, Jerzy; Mrugalski, Grzegorz; Rajski, Janusz

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