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[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS

✍ Scribed by Puglisi, Francesco M.; Pavan, Paolo; Padovani, Andrea; Larcher, Luca

Book ID: 126597516
Publisher: IEEE
Year: 2013
Weight: 900 KB
Category: Article
ISBN: 1479906492
DOI: 10.1109/ESSDERC.2013.6818845

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