𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of process variability on a frequency-addressed NEMS array sensor used for gravimetric detection

✍ Scribed by Martin, Olivier; Colinet, Eric; Sage, Eric; Dupre, Cecilia; Villard, Patrick; Hentz, Sebastien; Duraffourg, Laurent; Ernst, Thomas

Book ID: 124083508
Publisher: IEEE
Year: 2013
Weight: 772 KB
Category: Article
ISBN: 1479906492
DOI: 10.1109/ESSDERC.2013.6818820

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - MEMS for automotive and consumer electronics

✍ Finkbeiner, Stefan 📂 Article 📅 2013 🏛 IEEE ⚖ 903 KB

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Modeling the dynamic self-heating of PCM

✍ Marcolini, G.; Giovanardi, F.; Rudan, M.; Buscemi, F.; Piccinini, E.; Brunetti, 📂 Article 📅 2013 🏛 IEEE ⚖ 671 KB

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Electrical and thermoelectrical properties of gated InAs nanowires

✍ Mensch, Philipp; Karg, Siegfried; Gotsmann, Bernd; Das Kanungo, Pratyush; Schmid 📂 Article 📅 2013 🏛 IEEE ⚖ 574 KB

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Effect of ions presence in the SiOCH inter metal dielectric structure

✍ Rebuffat, B.; Della Marca, V.; Masson, P.; Ogier, J.-L.; Mantelli, M.; Paulet, O 📂 Article 📅 2013 🏛 IEEE ⚖ 535 KB

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Influence of device scaling on low-frequency noise in SOI tri-gate N- and p-type Si nanowire MOSFETs

✍ Koyama, M.; Casse, M.; Coquand, R.; Barraud, S.; Ghibaudo, G.; Iwai, H.; Reimbol 📂 Article 📅 2013 🏛 IEEE ⚖ 539 KB

[IEEE ESSDERC 2013 - 43rd European Solid

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Complementary n- and p-type TFETs on the same InAs/Al0.05Ga0.95Sb platform

✍ Baravelli, E.; Gnani, E.; Grassi, R.; Gnudi, A.; Reggiani, S.; Baccarani, G. 📂 Article 📅 2013 🏛 IEEE ⚖ 1024 KB