𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A silicon-based yield gain evaluation methodology for embedded-SRAMs with different redundancy scenarios

✍ Scribed by Rondey, E.; Tellier, Y.; Borri, S.

Book ID: 126738477
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 290 KB
Category: Article
ISBN-13: 9780769516172
DOI: 10.1109/MTDT.2002.1029764

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - An automated design methodology for EEPROM cell (ADE)

✍ Portal, J.M.; Forli, L.; Aziza, H.; Nee, D. 📂 Article 📅 2002 🏛 IEEE Comput. Soc ⚖ 457 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories

✍ Rei-Fu Huang, ; Jin-Fu Li, ; Jen-Chieh Yeh, ; Cheng-Wen Wu, 📂 Article 📅 2002 🏛 IEEE Comput. Soc 🌐 English ⚖ 274 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - Random testing of multi-port static random access memories

✍ Karimi, F.; Meyer, F.J.; Lombardi, F. 📂 Article 📅 2002 🏛 IEEE Comput. Soc 🌐 English ⚖ 348 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - March SS: a test for all static simple RAM faults

✍ Hamdioui, S.; van de Goor, A.J.; Rodgers, M. 📂 Article 📅 2002 🏛 IEEE Comput. Soc 🌐 English ⚖ 306 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - Design and implementation of a self-checking scheme for railway trackside systems

✍ Schiano, L.; Metra, C.; Marino, D. 📂 Article 📅 2002 🏛 IEEE Comput. Soc ⚖ 399 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch

✍ Gibbins, R.; Adams, R.D.; Eckenrode, T.; Ouellette, M.; Yuejian Wu, 📂 Article 📅 2002 🏛 IEEE Comput. Soc ⚖ 479 KB