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[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch

✍ Scribed by Gibbins, R.; Adams, R.D.; Eckenrode, T.; Ouellette, M.; Yuejian Wu,

Book ID: 126718649
Publisher: IEEE Comput. Soc
Year: 2002
Weight: 479 KB
Category: Article
ISBN-13: 9780769516172
DOI: 10.1109/MTDT.2002.1029767

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