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[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories

✍ Scribed by Rei-Fu Huang, ; Jin-Fu Li, ; Jen-Chieh Yeh, ; Cheng-Wen Wu,

Book ID: 126931238
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 274 KB
Category: Article
ISBN-13: 9780769516172
DOI: 10.1109/mtdt.2002.1029766

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