[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Bit parallel test pattern generation for path delay faults

[IEEE Comput. Soc. Press the European De

✍ van Brakel, G.; Glaser, U.; Kerkhoff, H.G.; Vierhaus, H.T. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 435 KB

[IEEE Comput. Soc. Press the European De

✍ van de Goor, A.J.; Schanstra, I.; Zorian, Y. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 515 KB

[IEEE Comput. Soc. Press the European De

✍ Kapoor, B. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 449 KB

[IEEE Comput. Soc. Press the European De

✍ Ayari, B.; Ben Hamida, N.; Kaminska, B. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 721 KB

[IEEE Comput. Soc. Press the European De

✍ Knittel, G.; Schilling, A. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 329 KB

[IEEE Comput. Soc. Press the European De

✍ Rochet, R.; Leveugle, R.; Saucier, G. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 111 KB