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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Gate delay fault test generation for non-scan circuits

โœ Scribed by van Brakel, G.; Glaser, U.; Kerkhoff, H.G.; Vierhaus, H.T.


Book ID
126594614
Publisher
IEEE Comput. Soc. Press
Year
1995
Tongue
English
Weight
435 KB
Category
Article
ISBN-13
9780818670398

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