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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Gate delay fault test generation for non-scan circuits

✍ Scribed by van Brakel, G.; Glaser, U.; Kerkhoff, H.G.; Vierhaus, H.T.

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