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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Functional test for shifting-type FIFOs

✍ Scribed by van de Goor, A.J.; Schanstra, I.; Zorian, Y.

Book ID: 126705816
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 515 KB
Category: Article
ISBN-13: 9780818670398
DOI: 10.1109/EDTC.1995.470408

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