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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Automatic test vector generation for mixed-signal circuits

โœ Scribed by Ayari, B.; Ben Hamida, N.; Kaminska, B.


Book ID
126633771
Publisher
IEEE Comput. Soc. Press
Year
1995
Weight
721 KB
Category
Article
ISBN-13
9780818670398

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