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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - A BIST approach to delay fault testing with reduced test length

✍ Scribed by Wurth, B.; Fuchs, K.

Book ID: 126705815
Publisher: IEEE Comput. Soc. Press
Year: 1995
Tongue: English
Weight: 630 KB
Category: Article
ISBN-13: 9780818670398
DOI: 10.1109/EDTC.1995.470362

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