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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - A built-in quiescent current monitor for CMOS VLSI circuits

✍ Scribed by Rubio, A.; Janssens, E.; Casier, H.; Figueras, J.; Mateo, D.; De Pauw, P.; Segura, J.

No coin nor oath required. For personal study only.

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