[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - Using sinusoidal stimuli and Fourier analyses for memory IC testing

[IEEE Comput. Soc. Press IEEE Internatio

[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - Design of an active memory system for network applications

✍ Asthana, A.; Cravatts, M.; Krzyzanowski, P. 📂 Article 📅 1994 🏛 IEEE Comput. Soc. Press ⚖ 611 KB

[IEEE Comput. Soc. Press IEEE Internatio

[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - Built-in random testing for dual-port RAMs

✍ Yokoyama, H.; Tamamoto, H.; Xiaoqing Wen, 📂 Article 📅 1994 🏛 IEEE Comput. Soc. Press ⚖ 399 KB

[IEEE Comput. Soc. Press IEEE Internatio

[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - GOS defects in SRAM: fault modeling and testing possibilities

✍ Segura, J.A.; Rubio, A. 📂 Article 📅 1994 🏛 IEEE Comput. Soc. Press ⚖ 444 KB

[IEEE Comput. Soc. Press IEEE Internatio

[IEEE Comput. Soc. Press IEEE International Workshop on Memory Technology, Design, and Test - San Jose, CA, USA (8-9 Aug. 1994)] Proceedings of IEEE International Workshop on Memory Technology, Design, and Test - Mechanical stress induced void and hillock formations in thin films

✍ Lahiri, S.K. 📂 Article 📅 1994 🏛 IEEE Comput. Soc. Press ⚖ 521 KB

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - A parallel approach for testing multi-port static random access memories

✍ Karimi, F.; Irrinki, S.; Crosbuy, T.; Lombardi, F. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 680 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm

[IEEE Comput. Soc 2001 IEEE Internationa

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - Low output resistance charge pump for flash memory programming

✍ Khouri, S.; Gregori, S.; Micheloni, R.; Soltesz, D.; Torelli, G. 📂 Article 📅 2001 🏛 IEEE Comput. Soc 🌐 English ⚖ 436 KB

The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithm