𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Montreal, Que., Canada (17-19 Oct. 1994)] IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Reliability estimation for time redundant error correcting adders and multipliers

✍ Scribed by Yuang-Ming Hsu, ; Swartzlander, E.E.

Book ID: 125534475
Publisher: IEEE Comput. Soc. Press
Year: 1994
Weight: 333 KB
Category: Article
ISBN-13: 9780818663079
DOI: 10.1109/DFTVS.1994.630026

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