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[IEEE Comput. Soc. Press Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - Washington, DC, USA (24-25 Oct. 1996)] Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - SHOrt Voltage Elevation (SHOVE) test

✍ Scribed by Chang, J.T.-Y.; McCluskey, E.J.

Book ID: 121819111
Publisher: IEEE Comput. Soc. Press
Year: 1996
Tongue: English
Weight: 567 KB
Category: Article
ISBN-13: 9780818676550
DOI: 10.1109/IDDQ.1996.557811

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