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[IEEE Comput. Soc Digest of Papers IEEE International Workshop on IDDQ Testing - Washington, DC, USA (5-6 Nov. 1997)] Digest of Papers IEEE International Workshop on IDDQ Testing - Detecting bridging faults in dynamic CMOS circuits

✍ Scribed by Chang, J.T.-Y.; McCluskey, E.J.

Book ID: 126709357
Publisher: IEEE Comput. Soc
Year: 1997
Weight: 384 KB
Category: Article
ISBN-13: 9780818681233
DOI: 10.1109/IDDQ.1997.633022

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