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[IEEE Comput. Soc Digest of Papers IEEE International Workshop on IDDQ Testing - Washington, DC, USA (5-6 Nov. 1997)] Digest of Papers IEEE International Workshop on IDDQ Testing - A high-speed low-voltage built-in current sensor

✍ Scribed by Tsung-Chu Huang, ; Min-Cheng Huang, ; Kuen-Jong Lee,

Book ID: 120211094
Publisher: IEEE Comput. Soc
Year: 1997
Weight: 445 KB
Category: Article
ISBN-13: 9780818681233
DOI: 10.1109/IDDQ.1997.633020

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