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[IEEE Comput. Soc. Press Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - Washington, DC, USA (24-25 Oct. 1996)] Digest of Papers 1996 IEEE International Workshop on IDDQ Testing - Semi-digital off-chip I/sub DDQ/ monitor developments: towards a general-purpose digital current monitor

✍ Scribed by Manhaeve, H.; Svajda, M.; Straka, B.

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