𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - An analytical model for delay and crosstalk estimation with application to decoupling

✍ Scribed by Becer, M.; Hajj, I.N.

Book ID: 120547200
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 196 KB
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/ISQED.2000.838853

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - A statistical model for electromigration failures

✍ Yoh, G.; Najm, F.N. 📂 Article 📅 2000 🏛 IEEE Comput. Soc ⚖ 258 KB

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Should yield be a design objective?

✍ Koren, I. 📂 Article 📅 2000 🏛 IEEE Comput. Soc ⚖ 95 KB

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Transistor modeling for the VDSM era

✍ Shur, M.S.; Fjeldly, T.A.; Ytterdal, T. 📂 Article 📅 2000 🏛 IEEE Comput. Soc 🌐 English ⚖ 159 KB

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Overview of SiGe technology modeling and application

✍ Yuan, J.S. 📂 Article 📅 2000 🏛 IEEE Comput. Soc ⚖ 140 KB

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Coupling noise analysis for VLSI and ULSI circuits

✍ Aingaran, K.; Klass, F.; Chin-Man Kim, ; Amir, C.; Mitral, J.; You, E.; Mohd, J. 📂 Article 📅 2000 🏛 IEEE Comput. Soc 🌐 English ⚖ 32 KB

[IEEE Comput. Soc IEEE 2000 1st Internat

[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Quick on-chip self- and mutual-inductance screen

✍ Shen Lin, ; Chang, N.; Nakagawa, S. 📂 Article 📅 2000 🏛 IEEE Comput. Soc 🌐 English ⚖ 57 KB