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[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Coupling noise analysis for VLSI and ULSI circuits

✍ Scribed by Aingaran, K.; Klass, F.; Chin-Man Kim, ; Amir, C.; Mitral, J.; You, E.; Mohd, J.; Sai-Keung Dong,

Book ID: 126171740
Publisher: IEEE Comput. Soc
Year: 2000
Tongue: English
Weight: 32 KB
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/ISQED.2000.838930

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