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[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - A statistical model for electromigration failures

✍ Scribed by Yoh, G.; Najm, F.N.

Book ID: 126594755
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 258 KB
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/ISQED.2000.838852

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