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[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - Overview of SiGe technology modeling and application

✍ Scribed by Yuan, J.S.

Book ID: 126698512
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 140 KB
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/ISQED.2000.838856

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