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[IEEE Comput. Soc IEEE 2000 1st International Symposium on Quality Electronic Design - San Jose, CA, USA (20-22 March 2000)] Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) - On testability of multiple precharged domino logic

✍ Scribed by Haniotakis, T.; Tsiatouhas, Y.; Nikolos, D.; Efstathiou, C.

Book ID: 126738442
Publisher: IEEE Comput. Soc
Year: 2000
Weight: 107 KB
Category: Article
ISBN-13: 9780769505251
DOI: 10.1109/ISQED.2000.838886

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