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[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Adaptive test scheduling in SoC's by dynamic partitioning

โœ Scribed by Dan Zhao, ; Upadhyaya, S.


Book ID
126619478
Publisher
IEEE Comput. Soc
Year
2002
Tongue
English
Weight
305 KB
Category
Article
ISBN-13
9780769518312

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