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[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Data compression for system-on-chip testing using ATE

✍ Scribed by Karimi, F.; Meleis, W.; Navabi, Z.; Lombardi, F.

Book ID: 120583699
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 913 KB
Category: Article
ISBN-13: 9780769518312
DOI: 10.1109/DFTVS.2002.1173513

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