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[IEEE 9th International Symposium on Power Semiconductor Devices and IC's - Weimar, Germany (26-29 May 1997)] Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's - Examination of punch through IGBT (PT-IGBT) for high voltage and high current applications

✍ Scribed by Mochizuki, K.; Ishii, K.; Takeda, M.; Hagino, H.; Yamada, T.

Book ID: 115442421
Publisher: IEEE
Year: 1997
Weight: 413 KB
Edition: 1997
Volume: 0
Category: Article
ISBN-13: 9780780339934
DOI: 10.1109/ispsd.1997.601481

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