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[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - The application of advanced techniques for complex focused-ion-beam device modification

✍ Scribed by Abramo, M.T.; Hahn, L.L.

Book ID: 121823369
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 450 KB
Category: Article
ISBN-13: 9780780333697
DOI: 10.1109/ESREF.1996.888213

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