[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Method for precise determination of the statistical distribution of the input offset voltage of differential stages

✍ Scribed by Thewes, R.; Schindhelm, T.; Tiebout, M.; Wohlrab, F.; Kollmer, U.; Kessel, S.; Schmitt-Landsiedel, D.; Weber, W.

• Book ID: 118053174
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 393 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780333697
• DOI: 10.1109/esref.1996.888224