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[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Electrical conduction and breakdown in sol-gel derived PZT thin films

โœ Scribed by Moazzami, R.; Hu, C.; Shepherd, W.H.


Book ID
126994886
Publisher
IEEE
Year
1990
Weight
338 KB
Category
Article

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