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[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Error analysis for optimal design of accelerated tests (electromigration)

✍ Scribed by Hannaman, D.J.; Zamani, N.; Dhiman, J.; Buehler, M.G.

Book ID: 126662315
Publisher: IEEE
Year: 1990
Weight: 318 KB
Category: Article
DOI: 10.1109/RELPHY.1990.66062

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