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[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Are electromigration failures lognormally distributed?

✍ Scribed by Towner, J.M.

Book ID: 111913932
Publisher: IEEE
Year: 1990
Weight: 542 KB
Volume: 0
Category: Article
DOI: 10.1109/relphy.1990.66070

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