𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Charge loss associated with program disturb stresses in EPROMs

✍ Scribed by Miller, T.; Illyes, S.; Baglee, D.A.

Book ID: 126724051
Publisher: IEEE
Year: 1990
Weight: 352 KB
Category: Article
DOI: 10.1109/RELPHY.1990.66079

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 28th Annual on Reliability Physics

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Are electromigration failures lognormally distributed?

✍ Towner, J.M. 📂 Article 📅 1990 🏛 IEEE ⚖ 542 KB

[IEEE 28th Annual on Reliability Physics

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Electrical measurements of moisture penetration through passivation

✍ Shirley, C.G.; Maston, S.C. 📂 Article 📅 1990 🏛 IEEE ⚖ 481 KB

[IEEE 28th Annual on Reliability Physics

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Error analysis for optimal design of accelerated tests (electromigration)

✍ Hannaman, D.J.; Zamani, N.; Dhiman, J.; Buehler, M.G. 📂 Article 📅 1990 🏛 IEEE ⚖ 318 KB

[IEEE 28th Annual on Reliability Physics

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Electrical conduction and breakdown in sol-gel derived PZT thin films

✍ Moazzami, R.; Hu, C.; Shepherd, W.H. 📂 Article 📅 1990 🏛 IEEE ⚖ 338 KB

[IEEE 28th Annual on Reliability Physics

[IEEE 28th Annual on Reliability Physics Symposium - New Orleans, LA, USA (27-29 March 1990)] 28th Annual Proceedings on Reliability Physics Symposium - Simulation and testing of temperature distribution and resistance versus power for SWEAT and related Joule-heated metal-on-insulator structures

✍ Crowell, C.R.; Shih, C.C.; Tyree, V. 📂 Article 📅 1990 🏛 IEEE ⚖ 427 KB