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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance

✍ Scribed by Liu, Chunsheng; Huang, Yu

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