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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Circuit Failure Prediction and Its Application to Transistor Aging

✍ Scribed by Agarwal, Mridul; Paul, Bipul C.; Zhang, Ming; Mitra, Subhasish

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