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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - A Low-Noise Amplifier with Integrated Current and Power Sensors for RF BIST Applications

✍ Scribed by Huang, Yen-Chih; Hsieh, Hsieh-Hung; Lu, Liang-Hung

No coin nor oath required. For personal study only.

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