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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Minimizing the Impact of Scan Compression

✍ Scribed by Wohl, P.; Waicukauski, J.A.; Kapur, R.; Ramnath, S.; Gizdarski, E.; Williams, T.W.; Jaini, P.

No coin nor oath required. For personal study only.

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