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[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Surface charging effects on current stability of AlGaN/GaN HEMTs

✍ Scribed by Nishiguchi, Kenya; Hashizume, Tamotsu

Book ID: 126754068
Publisher: IEEE
Year: 2014
Weight: 256 KB
Category: Article
ISBN: 1479936146
DOI: 10.1109/IMFEDK.2014.6867067

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