𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Study of the conduction mechanism of the DNA memory FET

✍ Scribed by Nakamura, Shohei; Matsuo, Naoto; Yamana, Kazushige; Heya, Akira; Takada, Tadao; Fukuyama, Masataka; Yokoyama, Shin

Book ID: 126297845
Publisher: IEEE
Year: 2014
Weight: 445 KB
Category: Article
ISBN: 1479936146
DOI: 10.1109/IMFEDK.2014.6867051

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Power electronics innovation by Silicon Carbide power semiconductor devices

✍ Okumura, Hajime 📂 Article 📅 2014 🏛 IEEE ⚖ 659 KB

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Design of CMOS resonating push-push frequency doubler

✍ Adachi, Hiroshi; Motoyoshi, Mizuki; Takano, Kyoya; Katayama, Kosuke; Amakawa, Sh 📂 Article 📅 2014 🏛 IEEE ⚖ 247 KB

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Surface charging effects on current stability of AlGaN/GaN HEMTs

✍ Nishiguchi, Kenya; Hashizume, Tamotsu 📂 Article 📅 2014 🏛 IEEE ⚖ 256 KB

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Quantum transport simulation of ultra-small V-groove junctionless transistors

✍ Yamana, Tatsuya; Mori, Nobuya 📂 Article 📅 2014 🏛 IEEE ⚖ 130 KB

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Gate voltage dependence of channel length modulation for InGaAs n-channel MOSFETs

✍ Matsuda, Akihiro; Hiroki, Akira; Goto, Yuta; Nakamura, Masaaki; Yoon, JongChul 📂 Article 📅 2014 🏛 IEEE ⚖ 327 KB

[IEEE 2014 IEEE International Meeting fo

[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Effect of passivation films on DC characteristics of AlGaN/GaN HEMT

✍ Ohi, S.; Kakegami, T.; Tokuda, H.; Kuzuhara, M. 📂 Article 📅 2014 🏛 IEEE ⚖ 238 KB