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[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Quantitative analysis for noise generated from share circuitries within DDR3 DRAM

✍ Scribed by Nam, I.; Lim, J.; Hwang, H.; Cho, K.; Choi, J.

Book ID: 127136757
Publisher: IEEE
Year: 2014
Weight: 439 KB
Category: Article
ISBN: 1479939099
DOI: 10.1109/ipfa.2014.6898126

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