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[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Junction induced variation and reliability for ultra-thin-body and bulk oxide MOSFETs

✍ Scribed by Yeh, Wen-Kuan; Chang, Wen-Teng; Chen, Po-Ying; Lin, Cheng-Li

Book ID: 126646457
Publisher: IEEE
Year: 2014
Weight: 238 KB
Category: Article
ISBN: 1479939099
DOI: 10.1109/IPFA.2014.6898123

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