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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis considerations in designing for EOS/ESD robustness

✍ Scribed by Hajjar, Jean-Jacques; Righter, Alan; Wolfe, Ed; Olney, Andrew

Book ID: 126710115
Publisher: IEEE
Year: 2013
Weight: 668 KB
Category: Article
ISBN: 1479912417
DOI: 10.1109/IPFA.2013.6599128

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