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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects

✍ Scribed by Tambara, Lucas A.; Tonfat, Jorge L.; Reis, Ricardo; Kastensmidt, Fernanda L.; Pereira, Evaldo C. F.; Vaz, Rafael G.; Goncalez, Odair L.

Book ID: 127093659
Publisher: IEEE
Year: 2014
Weight: 686 KB
Category: Article
ISBN: 1479947113
DOI: 10.1109/latw.2014.6841920

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