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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution

โœ Scribed by Lanot, Alisson J. C.; Balen, Tiago R.


Book ID
125811204
Publisher
IEEE
Year
2014
Weight
661 KB
Category
Article
ISBN
1479947113

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